@inbook{10498/14794,
year = {2012},
month = {1},
url = {http://hdl.handle.net/10498/14794},
abstract = {This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. In particular, the Peak Pairs approach for strain mapping with atomic column resolution, and a quantitative procedure to extract atomic column compositional information from Z-contrast high-resolution images are presented. It also reviews the structural, compositional, and strain results obtained by conventional and advanced transmission electron microscopy methods on a number of III–V semiconductor nanostructures and heterostructures.},
publisher = {Amalia Patanè & Naci Balkan},
title = {High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures},
author = {Sales Lérida, David and Beltrán Custodio, Ana María and Lozano, Juan G. and Mánuel Delgado, José Manuel and Guerrero Lebrero, María de la Paz and Ben Fernández, Teresa and Herrera Collado, Miriam and Morales, Francisco M. and Pizarro Junquera, Joaquín and Sánchez, Ana M. and Galindo Reaño, Pedro Luis and González Robledo, David and García Roja, Rafael and Molina Rubio, Sergio Ignacio},
}