@misc{10498/30345,
year = {2010},
url = {http://hdl.handle.net/10498/30345},
abstract = {Ordered porous alumina layers prepared by two-step anodising in phosphoric, oxalic and sulphuric acids
have been characterized at sub-nanometer scale using electron microscopy techniques. FEG-SEM and
STEM-HAADF images allowed estimating the pore size, cell wall and pore wall thicknesses of the layers.
Nanoanalytical characterization has been performed by STEM-EELS and STEM-X-EDS. Detailed features of
the spatial distribution of anions in the pore wall of the films have been obtained. Maximum concentration
of P-species occurs, approximately, at the middle of the pore wall; adjacent to the pore for C-species,
whereas the distribution of S-species appears to be uniform.},
publisher = {Elsevier},
title = {Direct sub-nanometer scale electron microscopy analysis of anion incorporation to self-ordered anodic alumina layers},
doi = {10.1016/j.corsci.2010.07.027},
author = {González Rovira, Leandro and López Haro, Miguel and Hungría Hernández, Ana Belén and El Amrani, K. and Sánchez Amaya, José María and Calvino Gámez, José Juan and Botana Pedemonte, Francisco Javier},
}