@misc{10498/30877,
year = {2013},
month = {9},
url = {http://hdl.handle.net/10498/30877},
abstract = {This paper presents an analysis of the SEE in-flight data of SRAMs on board Proba-II spacecraft. Proba-II spacecraft has been flying on a LEO orbit for more than 3 years. Observed in-flight error rates are compared with predictions based on ground test data.},
publisher = {IEEE- INST ELECTRICAL ELECTRONICS ENGINEERS},
keywords = {Time division multiplexing;Random access memory;Global Positioning System;Monitoring;Temperature sensors;Protons;Temperature measurement;Single Event Effect (SEE);Single Event Upset (SEU);Single Event Latch-up (SEL);radiation experiment;radiation monitor;Static Random Access Memory (SRAM);technology demonstration;hardness assurance},
title = {SRAMs SEL and SEU In-Flight Data From PROBA-II Spacecraft},
doi = {10.1109/RADECS.2013.6937398},
author = {D'Alessio, M. and Poivey, C. and Ferlet-Cavrois, V. and Evans, H. and Harboe-Sorensen, R. and Keating, A. and López Calle, Isabel and Guerre, F.X. and Lochon, F. and Santandrea, S. and Zadeh, A. and Muschitiello, M. and Markgraf, M. and Montenbruck, O. and Grillenberger, N. and Fleurinck, N. and Puimege, K. and Gerrits, D. and Matthijs, P.},
}