@misc{10498/31980,
year = {2022},
month = {8},
url = {http://hdl.handle.net/10498/31980},
abstract = {Gabor filters are described as functions product of a Gaussian-shaped kernel and a complex sinusoid 
function that minimizes the uncertainty principle between the spatial and frequency domains [1, 2]. 
These filters are specially utilized in computer vision for texture analysis and feature extraction of 
images, due the nature of the function itself it is possible to extract observations that are well defined 
and repetitive in the 2D space [3]. For this reason, the high periodicity registered in high resolution 
transmission electron microscopy (HRTEM) images of crystalline nanoparticles as well as and their 
shape morphology is highly exploitable. In this work we present a comprehensive method based on 
Gabor filters to localize in an automatic and efficient manner the nanoparticles, which can be 
implemented in dynamic studies using in situ transmission electron microscopy (TEM). In this way, 
orientation, and frequency of appearance of the features observed in the input signal are relevant to 
analyze the specimen, for instance, planes are rotated around the space occupied by each particle. An 
important parameter to be considered is the wavelength of the passed filters, which may be determined 
by the interplanar spacings of the high-resolution images.},
title = {Nanoparticle Localization Using Gabor Filters},
doi = {10.1017/S143192762201162X},
author = {Hernández-Robles, Andrei and Barcena González, Guillermo and Mayoral, Álvaro and Galindo Riaño, Pedro Luis and Ponce, Arturo},
}