%0 Journal Article 
%A Sales Lérida, David
%A Beltrán Custodio, Ana María
%A Lozano, Juan G.
%A Mánuel Delgado, José Manuel
%A Guerrero Lebrero, María de la Paz
%A Ben Fernández, Teresa
%A Herrera Collado, Miriam
%A Morales, Francisco M.
%A Pizarro Junquera, Joaquín
%A Sánchez, Ana M.
%A Galindo Reaño, Pedro Luis
%A González Robledo, David
%A García Roja, Rafael
%A Molina Rubio, Sergio Ignacio
%T High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures
%D 2012
%@ 978-3-642-23351-7
%U http://hdl.handle.net/10498/14794
%X This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. In particular, the Peak Pairs approach for strain mapping with atomic column resolution, and a quantitative procedure to extract atomic column compositional information from Z-contrast high-resolution images are presented. It also reviews the structural, compositional, and strain results obtained by conventional and advanced transmission electron microscopy methods on a number of III–V semiconductor nanostructures and heterostructures.
%~ Universidad de Cádiz