%0 Journal Article 
%A González Rovira, Leandro
%A López Haro, Miguel
%A Hungría Hernández, Ana Belén
%A El Amrani, K.
%A Sánchez Amaya, José María
%A Calvino Gámez, José Juan
%A Botana Pedemonte, Francisco Javier
%T Direct sub-nanometer scale electron microscopy analysis of anion incorporation to self-ordered anodic alumina layers
%D 2010
%@ 0010-938X
%U http://hdl.handle.net/10498/30345
%X Ordered porous alumina layers prepared by two-step anodising in phosphoric, oxalic and sulphuric acids
have been characterized at sub-nanometer scale using electron microscopy techniques. FEG-SEM and
STEM-HAADF images allowed estimating the pore size, cell wall and pore wall thicknesses of the layers.
Nanoanalytical characterization has been performed by STEM-EELS and STEM-X-EDS. Detailed features of
the spatial distribution of anions in the pore wall of the films have been obtained. Maximum concentration
of P-species occurs, approximately, at the middle of the pore wall; adjacent to the pore for C-species,
whereas the distribution of S-species appears to be uniform.
%~ Universidad de Cádiz