Exploring the Capability of HAADF-STEM Techniques to Characterize Graphene Distribution in Nanocomposites by Simulations

Thumbnail
Identificadores

URI: http://hdl.handle.net/10498/21881

DOI: 10.1155/2018/4906746

ISSN: 1687-4110

ISSN: 1687-4129

Files
Statistics
Metrics and citations
 
Share
Export
EndNoteBibTexRIS
Metadata
Show full item record
Author/s
Baladés Ruiz, NuriaAuthority UCA; Sales Lérida, DavidAuthority UCA; Herrera Collado, MiriamAuthority UCA; Molina Raya, Andrea; Hernández Garrido, Juan CarlosAuthority UCA; López Haro, MiguelAuthority UCA; Molina Rubio, Sergio IgnacioAuthority UCA
Date
2018
Department
Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica; Ingeniería Mecánica y Diseño Industrial
Source
Journal of NanomaterialsVolume 2018, Article ID 4906746, 12 pages
Abstract
This paper explores the capability of scanning transmission electron microscopy (STEM) techniques in determining the dispersion degree of graphene layers within the carbon matrix by using simulated high-angle annular dark-field (HAADF) images. Results ensure that unmarked graphene layers are only detectable if their orientation is parallel to the microscope beam. Additionally, gold-marked graphene layers allow evaluating the dispersion degree in structural composites. Moreover, electron tomography has been demonstrated to provide truthfully 3D distribution of the graphene sheets inside the matrix when an appropriate reconstruction algorithm and 2D projections including channelling effect are used
Collections
Atribución 4.0 Internacional
This work is under a Creative Commons License Atribución 4.0 Internacional