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dc.contributor.authorBakkali, Hicham
dc.contributor.authorBlanco Ollero, Eduardo
dc.contributor.authorLofland, S.E.
dc.contributor.authorDomínguez, M.
dc.contributor.otherFísica de la Materia Condensadaes_ES
dc.date.accessioned2020-10-06T10:28:37Z
dc.date.available2020-10-06T10:28:37Z
dc.date.issued2020-08
dc.identifier.issn1367-2630
dc.identifier.urihttp://hdl.handle.net/10498/23696
dc.description.abstractWe report on the electronic and optical properties of ultrathin granular films. We demonstrate that the static dielectric constant increases with thickness in the dielectric regime and diverges at the critical thickness, as predicted by classical percolation theory. However, for thicker samples, the dc conductivity does not obey scaling laws due to the presence of tunneling conduction. In this region the dielectric constant is positive, and the electronic transport is not metallic but can be described by Jonscher's universal power law, even though there is a Drude-like response indicating the presence of free charge carriers. Only for thicker films when the dielectric constant becomes negative is there metallic conduction.es_ES
dc.formatapplication/pdfes_ES
dc.language.isoenges_ES
dc.publisherIOP PUBLISHING LTDes_ES
dc.rightsAtribución 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/*
dc.sourceNew J. Phys.22(2020) 083018es_ES
dc.subjectpercolationes_ES
dc.subjecttunneling conductiones_ES
dc.subjectoptical conductivityes_ES
dc.titleDivergence of the dielectric constant in ultrathin granular metal films near the percolation thresholdes_ES
dc.typeinfo:eu-repo/semantics/articlees_ES
dc.rights.accessRightsinfo:eu-repo/semantics/openAccesses_ES
dc.identifier.doi10.1088/1367-2630/aba021


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Atribución 4.0 Internacional
This work is under a Creative Commons License Atribución 4.0 Internacional