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SRAMs SEL and SEU In-Flight Data From PROBA-II Spacecraft
| dc.contributor.author | D'Alessio, M. | |
| dc.contributor.author | Poivey, C. | |
| dc.contributor.author | Ferlet-Cavrois, V. | |
| dc.contributor.author | Evans, H. | |
| dc.contributor.author | Harboe-Sorensen, R. | |
| dc.contributor.author | Keating, A. | |
| dc.contributor.author | López Calle, Isabel | |
| dc.contributor.author | Guerre, F.X. | |
| dc.contributor.author | Lochon, F. | |
| dc.contributor.author | Santandrea, S. | |
| dc.contributor.author | Zadeh, A. | |
| dc.contributor.author | Muschitiello, M. | |
| dc.contributor.author | Markgraf, M. | |
| dc.contributor.author | Montenbruck, O. | |
| dc.contributor.author | Grillenberger, N. | |
| dc.contributor.author | Fleurinck, N. | |
| dc.contributor.author | Puimege, K. | |
| dc.contributor.author | Gerrits, D. | |
| dc.contributor.author | Matthijs, P. | |
| dc.contributor.other | Ingeniería en Automática, Electrónica, Arquitectura y Redes de Computadores | es_ES |
| dc.date.accessioned | 2024-02-08T13:22:28Z | |
| dc.date.available | 2024-02-08T13:22:28Z | |
| dc.date.issued | 2013-09 | |
| dc.identifier.issn | 978-146735057-0 | |
| dc.identifier.uri | http://hdl.handle.net/10498/30877 | |
| dc.description.abstract | This paper presents an analysis of the SEE in-flight data of SRAMs on board Proba-II spacecraft. Proba-II spacecraft has been flying on a LEO orbit for more than 3 years. Observed in-flight error rates are compared with predictions based on ground test data. | es_ES |
| dc.format | application/pdf | es_ES |
| dc.language.iso | eng | es_ES |
| dc.publisher | IEEE- INST ELECTRICAL ELECTRONICS ENGINEERS | es_ES |
| dc.source | 4th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Oxford, UK, 2013, pp. 1-8 | es_ES |
| dc.subject | Time division multiplexing;Random access memory;Global Positioning System;Monitoring;Temperature sensors;Protons;Temperature measurement;Single Event Effect (SEE);Single Event Upset (SEU);Single Event Latch-up (SEL);radiation experiment;radiation monitor;Static Random Access Memory (SRAM);technology demonstration;hardness assurance | es_ES |
| dc.title | SRAMs SEL and SEU In-Flight Data From PROBA-II Spacecraft | es_ES |
| dc.type | conference output | es_ES |
| dc.rights.accessRights | closed access | es_ES |
| dc.identifier.doi | 10.1109/RADECS.2013.6937398 | |
| dc.type.hasVersion | VoR | es_ES |
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