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A Lightweight Method for Detecting and Correcting Errors in Low-Frequency Measurements for In-Orbit Demonstrators

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URI: http://hdl.handle.net/10498/32143

DOI: 10.3390/s24041065

ISSN: 1424-8220

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Author/s
Cifredo Chacón, María ÁngelesAuthority UCA; Guerrero Rodríguez, José MaríaAuthority UCA; Mateos Martín, José IgnacioAuthority UCA
Date
2024-02-06
Department
Ingeniería en Automática, Electrónica, Arquitectura y Redes de Computadores
Source
Sensors. 2024; Vol. 24 n-4 pp.1065
Abstract
In the pursuit of enhancing the technological maturity of innovative magnetic sensing techniques, opportunities presented by in-orbit platforms (IOD/IOV experiments) provide a means to evaluate their in-flight capabilities. The Magnetic Experiments for the Laser Interferometer Space Antenna (MELISA) represent a set of in-flight demonstrators designed to characterize the low-frequency noise performance of a magnetic measurement system within a challenging space environment. In Low Earth Orbit (LEO) satellites, electronic circuits are exposed to high levels of radiation coming from energetic particles trapped by the Earth’s magnetic field, solar flares, and galactic cosmic rays. A significant effect is the accidental bit-flipping in memory registers. This work presents an analysis of memory data redundancy resources using auxiliary second flash memory and exposes recovery options to retain critical data utilizing a duplicated data structure. A new and lightweight technique, CCM (Cross-Checking and Mirroring), is proposed to verify the proper performance of these techniques. Four alternative algorithms included in the original version of the MELISA software (Version v0.0) are presented. All the versions have been validated and evaluated according to various merit indicators. The evaluations showed similar performances for the proposed techniques, and they are valid for situations in which the flash memory suffers from more than one bit-flip. The overhead due to the introduction of additional instructions to the main code is negligible, even in the target experiment based on an 8-bit microcontroller.
Subjects
LEO orbit; proton; heavy ion; Single-Event Upset (SEU); Multiple-Bit Upset (MBU); flash memory reliability; satellite; electronic
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  • Artículos Científicos [11595]
  • Articulos Científicos Ing. Sis. Aut. [180]
Attribution 4.0 Internacional
This work is under a Creative Commons License Attribution 4.0 Internacional

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