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dc.contributor.authorBakkali, Hicham 
dc.contributor.authorDomínguez de la Vega, Manuel 
dc.contributor.otherCiencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánicaes_ES
dc.contributor.otherFísica de la Materia Condensadaes_ES
dc.date.accessioned2025-07-28T08:11:21Z
dc.date.available2025-07-28T08:11:21Z
dc.date.issued2025
dc.identifier.issn1873-4979
dc.identifier.issn0167-577X
dc.identifier.urihttp://hdl.handle.net/10498/36902
dc.description.abstractThis study maps the electrical behavior across a 7 × 7 μm2 nanogranular ultrathin Pd-ZrO2 film, revealing nonlinear I-V characteristics indicative of single-electron tunneling. Following the Coulomb blockade power law I ∼ (V − Vt)ξ with a scaling exponent ξ ≈ 1.2, these characteristics appear above the threshold voltage Vt. By modeling the nanogranular structure as a 1D array of multitunnel junctions, we demonstrate a linear relationship between Vt and tunnel channel length, allowing for a better understanding of nanoscale electrical properties and supporting the development of sensitive sensors.es_ES
dc.formatapplication/pdfes_ES
dc.language.isoenges_ES
dc.publisherElsevier B.V.es_ES
dc.rightsAtribución 4.0 Internacional*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/*
dc.sourceMaterials Letters - 2025, Vol. 382, artículo n. 137932es_ES
dc.subjectConductive atomic force microscopyes_ES
dc.subjectElectrical characteristicses_ES
dc.subjectanogranular ultrathin filmses_ES
dc.subjectSingle-electron tunnelinges_ES
dc.titleUnveiling single-electron tunneling in nanogranular ultrathin films for sensor applications via hyperspectral conductive AFMes_ES
dc.typejournal articlees_ES
dc.rights.accessRightsopen accesses_ES
dc.identifier.doi10.1016/j.matlet.2024.137932
dc.relation.projectIDinfo:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/EQC2018-004704-P/ES/Modernización del Servicio de Microscopía deFuerza Atómica (AFM) del IMEYMATes_ES
dc.type.hasVersionVoRes_ES


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Atribución 4.0 Internacional
This work is under a Creative Commons License Atribución 4.0 Internacional