RT book part
T1 High-Resolution Electron Microscopy of Semiconductor Heterostructures and Nanostructures
A1 Sales Lérida, David
A1 Beltrán Custodio, Ana María
A1 Lozano, Juan G.
A1 Mánuel Delgado, José Manuel
A1 Guerrero Lebrero, María de la Paz
A1 Ben Fernández, Teresa
A1 Herrera Collado, Miriam
A1 Morales, Francisco M.
A1 Pizarro Junquera, Joaquín
A1 Sánchez, Ana M.
A1 Galindo Reaño, Pedro Luis
A1 González Robledo, David
A1 García Roja, Rafael
A1 Molina Rubio, Sergio Ignacio
A2 Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
AB This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. In particular, the Peak Pairs approach for strain mapping with atomic column resolution, and a quantitative procedure to extract atomic column compositional information from Z-contrast high-resolution images are presented. It also reviews the structural, compositional, and strain results obtained by conventional and advanced transmission electron microscopy methods on a number of III–V semiconductor nanostructures and heterostructures.
PB Amalia Patanè & Naci Balkan
SN 978-3-642-23351-7
YR 2012
FD 2012-01-01T00:00:00Z
LK http://hdl.handle.net/10498/14794
UL http://hdl.handle.net/10498/14794
LA eng
DS Repositorio Institucional de la Universidad de Cádiz
RD 21-sep-2026