RT journal article
T1 Direct sub-nanometer scale electron microscopy analysis of anion incorporation to self-ordered anodic alumina layers
A1 González Rovira, Leandro
A1 López Haro, Miguel
A1 Hungría Hernández, Ana Belén
A1 El Amrani, K.
A1 Sánchez Amaya, José María
A1 Calvino Gámez, José Juan
A1 Botana Pedemonte, Francisco Javier
A2 Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
AB Ordered porous alumina layers prepared by two-step anodising in phosphoric, oxalic and sulphuric acidshave been characterized at sub-nanometer scale using electron microscopy techniques. FEG-SEM andSTEM-HAADF images allowed estimating the pore size, cell wall and pore wall thicknesses of the layers.Nanoanalytical characterization has been performed by STEM-EELS and STEM-X-EDS. Detailed features ofthe spatial distribution of anions in the pore wall of the films have been obtained. Maximum concentrationof P-species occurs, approximately, at the middle of the pore wall; adjacent to the pore for C-species,whereas the distribution of S-species appears to be uniform.
PB Elsevier
SN 0010-938X
YR 2010
FD 2010
LK http://hdl.handle.net/10498/30345
UL http://hdl.handle.net/10498/30345
LA eng
DS Repositorio Institucional de la Universidad de Cádiz
RD 06-nov-2026