RT journal article
T1 Modification of the LM124 Single Event Transients by Load Resistors
A1 Franco, F.J.
A1 López Calle, Isabel
A1 Izquierdo, J.G.
A1 Agapito, J.G.
A2 Ingeniería en AutomáticaElectrónica, Arquitectura y Redes de Computadores
AB The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the reasons of this behavior and showed that the distortion is related to the necessity of providing or absorbing current from the load resistor, which forces the amplifier to modify its operation point. Finally, load effects were successfully used to explain the distortion of single event transients in typical feed-back networks and the results were used to explain experimental data reported elsewhere.
PB IEEE- INST ELECTRICAL ELECTRONICS ENGINEERS
SN 018-9499
YR 2010
FD 2010-02
LK http://hdl.handle.net/10498/30771
UL http://hdl.handle.net/10498/30771
LA eng
DS Repositorio Institucional de la Universidad de Cádiz
RD 10-may-2026