RT conference output
T1 SRAMs SEL and SEU In-Flight Data From PROBA-II Spacecraft
A1 D'Alessio, M.
A1 Poivey, C.
A1 Ferlet-Cavrois, V.
A1 Evans, H.
A1 Harboe-Sorensen, R.
A1 Keating, A.
A1 López Calle, Isabel
A1 Guerre, F.X.
A1 Lochon, F.
A1 Santandrea, S.
A1 Zadeh, A.
A1 Muschitiello, M.
A1 Markgraf, M.
A1 Montenbruck, O.
A1 Grillenberger, N.
A1 Fleurinck, N.
A1 Puimege, K.
A1 Gerrits, D.
A1 Matthijs, P.
A2 Ingeniería en AutomáticaElectrónica, Arquitectura y Redes de Computadores
K1 Time division multiplexing;Random access memory;Global Positioning System;Monitoring;Temperature sensors;Protons;Temperature measurement;Single Event Effect (SEE);Single Event Upset (SEU);Single Event Latch-up (SEL);radiation experiment;radiation monitor;Static Random Access Memory (SRAM);technology demonstration;hardness assurance
AB This paper presents an analysis of the SEE in-flight data of SRAMs on board Proba-II spacecraft. Proba-II spacecraft has been flying on a LEO orbit for more than 3 years. Observed in-flight error rates are compared with predictions based on ground test data.
PB IEEE- INST ELECTRICAL ELECTRONICS ENGINEERS
SN 978-146735057-0
YR 2013
FD 2013-09
LK http://hdl.handle.net/10498/30877
UL http://hdl.handle.net/10498/30877
LA eng
DS Repositorio Institucional de la Universidad de Cádiz
RD 10-may-2026