RT journal article
T1 Correcting sample drift using Fourier harmonics
A1 Barcena González, Guillermo
A1 Guerrero Lebrero, María de la Paz
A1 Guerrero Vázquez, Elisa
A1 Reyes, David F.
A1 Braza, V.
A1 Yañez Escolano, Andrés
A1 Núñez Moraleda, Bernardo Miguel
A1 González, David
A1 Galindo Riaño, Pedro Luis
A2 Ingeniería Informática
K1 Drift correction
K1 Image distortion
K1 Fourier analysis
K1 Harmonic analysis
AB During image acquisition of crystalline materials by high-resolution scanning transmission electron microscopy, the sample drift could lead to distortions and shears that hinder their quantitative analysis and characterization. In order to measure and correct this effect, several authors have proposed different methodologies making use of series of images. In this work, we introduce a methodology to determine the drift angle via Fourier analysis by using a single image based on the measurements between the angles of the second Fourier harmonics in different quadrants. Two different approaches, that are independent of the angle of acquisition of the image, are evaluated. In addition, our results demonstrate that the determination of the drift angle is more accurate by using the measurements of non-consecutive quadrants when the angle of acquisition is an odd multiple of 45°.
SN 0968-4328
YR 2018
FD 2018-04-21
LK http://hdl.handle.net/10498/31815
UL http://hdl.handle.net/10498/31815
LA eng
DS Repositorio Institucional de la Universidad de Cádiz
RD 08-nov-2026