RT journal article
T1 CDrift: An Algorithm to Correct Linear Drift From A Single High-Resolution STEM Image
A1 Barcena González, Guillermo
A1 Guerrero Lebrero, María de la Paz
A1 Guerrero Vázquez, Elisa
A1 Yañez Escolano, Andrés
A1 Núñez Moraleda, Bernardo Miguel
A1 Fernández de los Reyes, Daniel
A1 Real, Pedro
A1 González Robledo, David
A1 Galindo Riaño, Pedro Luis
A2 Ingeniería Informática
A2 Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
K1 Drift correction
K1 Fourier analysis
K1 Image distortion
AB In this work, a new method to determine and correct the linear drift for any crystalline orientation in a single-column-resolved high-resolution scanning transmission electron microscopy (HR-STEM) image, which is based on angle measurements in the Fourier space, is presented. This proposal supposes a generalization and the improvement of a previous work that needs the presence of two symmetrical planes in the crystalline orientation to be applicable. Now, a mathematical derivation of the drift effect on two families of asymmetric planes in the reciprocal space is inferred. However, though it was not possible to find an analytical solution for all conditions, a simple formula was derived to calculate the drift effect that is exact for three specific rotation angles. Taking this into account, an iterative algorithm based on successive rotation/drift correction steps is devised to remove drift distortions in HR-STEM images. The procedure has been evaluated using a simulated micrograph of a monoclinic material in an orientation where all the reciprocal lattice vectors are different. The algorithm only needs four iterations to resolve a 15° drift angle in the image.
SN 1431-9276
YR 2020
FD 2020-10-01
LK http://hdl.handle.net/10498/32003
UL http://hdl.handle.net/10498/32003
LA eng
DS Repositorio Institucional de la Universidad de Cádiz
RD 07-nov-2026