RT journal article
T1 Characterization of NiCuOxNy Coatings Obtained via RF Sputtering: Structure, Morphology, and Optical Properties
A1 Velásquez-Méndez, Karen Lizzee
A1 Alfonso, José Edgar
A1 Bethencourt Núñez, Manuel
A1 Cifredo Chacón, Gustavo Aurelio
A1 Cubillos, Gloria Ivonne
A2 Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
K1 NiCuOxNy films
K1 band gap
K1 semiconductor
AB The rapid advancement of technology necessitates the continual development of versatile materials that can adapt to new electronic devices. Rare earth elements, which are scarce in nature,  possess the set of properties required for use as semiconductors. Consequently, this research aims  to achieve similar properties using materials that are abundant in nature and have a low commercial  cost. To this end, nickel and copper were utilized to synthesize thin films of nickel–copper binary oxynitride via reactive RF sputtering.  The influence of nitrogen flow on the structure, morphology,  chemical composition, and optical properties of the films was investigated using various  characterization techniques, including X-ray diffraction (XRD), scanning electron microscopy  (SEM), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS), as well as transmittance and adsorbance measurements.
SN 1996-1944
YR 2024
FD 2024-07-02
LK http://hdl.handle.net/10498/32878
UL http://hdl.handle.net/10498/32878
LA eng
DS Repositorio Institucional de la Universidad de Cádiz
RD 12-nov-2026