RT journal article
T1 A simple algorithm for measuring particle size distributions on an uneven background from TEM images
A1 Cervera Gontard, Lionel
A1 Ozkaya, Dogan
A1 Dunin-Borkowski, Rafal E
A2 Física de la Materia Condensada
AB Nanoparticles have a wide range of applications in science and technology. Their sizes are often measured using transmission electron microscopy (TEM) or X-ray diffraction. Here, we describe a simple computer algorithm for measuring particle size distributions from TEM images in the presence of an uneven background. The approach is based on adaptive thresholding, making use of local threshold values that change with spatial coordinate. The algorithm allows particles to be detected and characterized with greater accuracy than using more conventional methods, in which a global threshold is used. Its application to images of heterogeneous catalysts is presented. (C) 2010 Elsevier B.V. All rights reserved.
PB Elsevier
SN 0304-3991
YR 2011
FD 2011
LK http://hdl.handle.net/10498/35020
UL http://hdl.handle.net/10498/35020
LA eng
DS Repositorio Institucional de la Universidad de Cádiz
RD 15-nov-2026