RT journal article
T1 Review and novel formulae for transmittance and reflectance of wedged thin films on absorbing substrates
A1 Ballester, Manuel
A1 Márquez Navarro, Emilio José
A1 Bass, John
A1 Würsch, Christoph
A1 Willomitzer, Florian
A1 Katsaggelos, Aggelos K.
A2 Física de la Materia Condensada
K1 thin solid films
K1 spectrophotometry
K1 transmittance
K1 reflectance
K1 wedge-shaped films
K1 substrate absorption
AB Historically, spectroscopic techniques have been essential for studying the optical properties of thin solid films. However, existing formulae for both normal transmission and reflection spectroscopy often rely on simplified theoretical assumptions, which may not accurately align with real-world conditions. For instance, it is common to assume (1) that the thin solid layers are deposited on completely transparent thick substrates and (2) that the film surface forms a specular plane with a relatively small wedge angle. While recent studies have addressed these assumptions separately, this work presents an integrated framework that eliminates both assumptions simultaneously. In addition, the current work presents a deep review of various formulae from the literature, each with their corresponding levels of complexity. Our review analysis highlights a critical trade-off between computational complexity and expression accuracy, where the newly developed formulae offer enhanced accuracy at the expense of increased computational time. Our user-friendly code, which includes several classical transmittance and reflectance formulae from the literature and our newly proposed expressions, is publicly available in both Python and Matlab at this link.
PB Institute of Physics
SN 1361-6501
YR 2025
FD 2025
LK http://hdl.handle.net/10498/36450
UL http://hdl.handle.net/10498/36450
LA eng
DS Repositorio Institucional de la Universidad de Cádiz
RD 10-may-2026