TY  - GEN 
AU  - Minkov, Dorian
AU  - Márquez Navarro, Emilio José
AU  - Angelov, George
AU  - Gavrilov, Gavril
AU  - Ruano, Susana
AU  - Saugar, Elias
A4  - Física de la Materia Condensada
PY  - 2021
SN  - 1996-1944
UR  - http://hdl.handle.net/10498/25743
AB  - Three means are investigated for further increasing the accuracy of the characterization of a thin film on a substrate, from the transmittance spectrum T(lambda) of the specimen, based on the envelope method. Firstly, it is demonstrated that the...
LA  - eng
PB  - MDPI
KW  - increased characterization accuracy
KW  - thin film
KW  - envelope method
KW  - dielectric film
KW  - semiconductor film
KW  - transmittance spectrum
TI  - Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum
DO  - 10.3390/ma14164681
ER  -