TY  - GEN 
AU  - Valencia Liñán, Luisa María
AU  - Mata Fernández, María de la
AU  - Herrera Collado, Miriam
AU  - Delgado González, Francisco Javier
AU  - Hernández Saz, Jesús
AU  - Molina Rubio, Sergio Ignacio
A4  - Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
PY  - 2022
SN  - 0141-3910
UR  - http://hdl.handle.net/10498/27273
AB  - (Scanning) transmission electron microscopy, (S)TEM, offers a powerful characterization tool based on electronmatter
interactions, highly valuable in materials science. However, the possible electron beam induced damage
during (S)TEM measurements...
LA  - eng
PB  - ELSEVIER
KW  - STEM-EELS
KW  - Acrylic resin
KW  - Electron-beam damage
KW  - Degradation mechanism
KW  - Radiolysis
KW  - Knock-on
TI  - Induced damage during STEM-EELS analyses on acrylic-based materials for Stereolithography
DO  - 10.1016/j.polymdegradstab.2022.110044
ER  -