TY  - GEN 
AU  - Sáenz Noval, Jorge Johanny
AU  - Gómez-Merchán, Rubén
AU  - Leñero Bardallo, Juan Antonio
AU  - Cervera Gontard, Lionel
A4  - Física de la Materia Condensada
PY  - 2023
SN  - 1521-4117
UR  - http://hdl.handle.net/10498/28018
AB  - An essential application of electron microscopy is to provide feedback to tune the fabrication of nanoparticles (NPs). Real samples tend to follow a size distribution commonly linked to the synthesis process used and in turn to their functional...
LA  - eng
PB  - WILEY
KW  - electron microscopy
KW  - nanometrology
KW  - nanoparticles
KW  - template matching
KW  - transmission electron microscopy
TI  - TEMAS: A Flexible Non-AI Algorithm for Metrology of Single-Core and Core-Shell Nanoparticles from TEM Images
DO  - 10.1002/ppsc.202200170
ER  -