TY  - GEN 
AU  - Franco, F.J.
AU  - López Calle, Isabel
AU  - Izquierdo, J.G.
AU  - Agapito, J.G.
A4  - Ingeniería en Automática, Electrónica, Arquitectura y Redes de Computadores
PY  - 2010
SN  - 018-9499
UR  - http://hdl.handle.net/10498/30771
AB  - The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the...
LA  - eng
PB  - IEEE- INST ELECTRICAL ELECTRONICS ENGINEERS
TI  - Modification of the LM124 Single Event Transients by Load Resistors
DO  - 10.1109/TNS.2009.2037894
ER  -