TY  - GEN 
AU  - Barcena González, Guillermo
AU  - Guerrero Lebrero, María de la Paz
AU  - Guerrero Vázquez, Elisa
AU  - Reyes, David F.
AU  - Braza, V.
AU  - Yañez Escolano, Andrés
AU  - Núñez Moraleda, Bernardo Miguel
AU  - González, David
AU  - Galindo Riaño, Pedro Luis
A4  - Ingeniería Informática
PY  - 2018
SN  - 0968-4328
UR  - http://hdl.handle.net/10498/31815
AB  - During image acquisition of crystalline materials by high-resolution scanning transmission electron microscopy, the sample drift could lead to distortions and shears that hinder their quantitative analysis and characterization. In order to measure and...
LA  - eng
KW  - Drift correction
KW  - Image distortion
KW  - Fourier analysis
KW  - Harmonic analysis
TI  - Correcting sample drift using Fourier harmonics
DO  - https://doi.org/10.1016/j.micron.2018.04.004
ER  -