TY  - GEN 
AU  - Minkov, Dorian
AU  - Angelov, George
AU  - Márquez Navarro, Emilio José
AU  - Radonov, R.
AU  - Rusev, R.
AU  - Nikolov, D.
AU  - Ruano, S.
A4  - Física de la Materia Condensada
PY  - 2023
SN  - 2079-4991
UR  - http://hdl.handle.net/10498/32099
AB  - OEMT is an existing optimizing envelope method for thin-film characterization that uses only one transmittance spectrum, T(λ), of the film deposited on the substrate. OEMT computes the optimized values of the average thickness, (Formula presented.),...
LA  - eng
PB  - Multidisciplinary Digital Publishing Institute (MDPI)
KW  - accurate characterization
KW  - dispersion model
KW  - optimized envelope method
KW  - reflectance spectrum
KW  - semiconductor or insulator
KW  - spectrophotometry
KW  - thin film
TI  - Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample
DO  - 10.3390/NANO13172407
ER  -