TY  - GEN 
AU  - Saborido Barba, Nieves
AU  - García López, María del Carmen
AU  - Clavijo Blanco, José Antonio
AU  - Jiménez Castañeda, Rafael
AU  - Álvarez Tey, Germán
A4  - Ingeniería Eléctrica
PY  - 2024
SN  - 1424-8220
UR  - http://hdl.handle.net/10498/32838
AB  - Photovoltaic panels are exposed to various external factors that can cause damage, with
the formation of cracks in the photovoltaic cells being one of the most recurrent issues affecting their
production capacity. Electroluminescence (EL) tests are...
LA  - eng
PB  - MDPI
KW  - photovoltaic modules
KW  - electroluminescence
KW  - defects
KW  - substring
KW  - defect analysis tool
KW  - performance
TI  - Methodology for Calculating the Damaged Surface and Its Relationship with Power Loss in Photovoltaic Modules by Electroluminescence Inspection for Corrective Maintenance
DO  - https://doi.org/10.3390/s24051479
ER  -