TY  - GEN 
AU  - Cervera Gontard, Lionel
AU  - Batista Ponce, Moisés
AU  - Salguero Gómez, Jorge
AU  - Calvino Gámez, José Juan
A4  - Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
A4  - Física de la Materia Condensada
A4  - Ingeniería Mecánica y Diseño Industrial
PY  - 2018
SN  - 2045-2322
UR  - http://hdl.handle.net/10498/32942
AB  - The slice and view approach in electron microscopy defines an ensemble of destructive techniques that is widely used for studying in 3D the structure and chemistry of samples with dimensions ranging from µm to mm. Here, a method is presented for...
LA  - eng
PB  - Nature Publishing Group
TI  - Three-dimensional chemical mapping using non-destructive SEM and photogrammetry
DO  - 10.1038/s41598-018-29458-8
ER  -