TY  - GEN 
AU  - García, Alejandra
AU  - Raya, Andrés M.
AU  - Mariscal, Marcelo M.
AU  - Esparza, Rodrigo
AU  - Herrera Collado, Miriam
AU  - Molina Rubio, Sergio Ignacio
AU  - Scavello, Giovanni
AU  - Galindo Riaño, Pedro Luis
AU  - Jose-Yacaman, Miguel
AU  - Ponce, Arturo
A4  - Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
A4  - Ingeniería Informática
PY  - 2014
SN  - 1879-2723
SN  - 0304-3991
UR  - http://hdl.handle.net/10498/33467
AB  - In this work we examined MoS2 sheets by aberration-corrected scanning transmission electron microscopy (STEM) at three different energies: 80, 120 and 200 kV. Structural damage of the MoS2 sheets has been controlled at 80 kV according a theoretical...
LA  - eng
PB  - Elsevier
KW  - Low-voltage transmission electron microscopy
KW  - Aberration-corrected microscopy
KW  - Molybdenum disulfide
KW  - Radiation damage
TI  - Analysis of electron beam damage of exfoliated MoS2 sheets and quantitative HAADF-STEM imaging
DO  - 10.1016/j.ultramic.2014.05.004
ER  -