TY  - GEN 
AU  - Jiménez Ríos, Juan Jesús
AU  - Manuel Delgado, José Manuel
AU  - Bartsch, Heike
AU  - Breiling, Jonnas
AU  - García Roja, Rafael
AU  - Jacobs, Heiko Otto
AU  - Müller, Jens
AU  - Pezodlt, Jörg
AU  - Morales Sánchez, Francisco Miguel
A4  - Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
A4  - Física de la Materia Condensada
PY  - 2019
SN  - 0272-8842
UR  - http://hdl.handle.net/10498/34047
AB  - Three GaN layers grown on polished AlN buffer films previously sputtered on Low-Temperature Co-fired Ceramic substrates have been studied by X-Ray Diffraction, Atomic Force Microscopy and Electron Microscopy related techniques. This allowed to assess...
LA  - eng
PB  - Elsevier
KW  - Low temperature cofired ceramic
KW  - Hybrid materials
KW  - Aluminum nitride
KW  - Electron microscopy
KW  - Gallium nitride
TI  - Comprehensive (S)TEM characterization of polycrystalline GaN/AlN layers grown on LTCC substrates
DO  - 10.1016/j.ceramint.2019.01.250
ER  -