TY  - GEN 
AU  - Cervera Gontard, Lionel
AU  - Ozkaya, Dogan
AU  - Dunin-Borkowski, Rafal E
A4  - Física de la Materia Condensada
PY  - 2011
SN  - 0304-3991
UR  - http://hdl.handle.net/10498/35020
AB  - Nanoparticles have a wide range of applications in science and technology. Their sizes are often measured using transmission electron microscopy (TEM) or X-ray diffraction. Here, we describe a simple computer algorithm for measuring particle size...
LA  - eng
PB  - Elsevier
TI  - A simple algorithm for measuring particle size distributions on an uneven background from TEM images
DO  - 10.1016/J.ULTRAMIC.2010.10.011
ER  -