TY  - GEN 
AU  - Gallero Rebollo, Enrique
AU  - Outón Porras, Javier
AU  - Vázquez Martínez, Juan Manuel
AU  - Ledesma, Javier
AU  - Cervera Gontard, Lionel
AU  - Salguero Gómez, Jorge
A4  - Física de la Materia Condensada
A4  - Ingeniería Mecánica y Diseño Industrial
PY  - 2025
SN  - 1433-3015
UR  - http://hdl.handle.net/10498/38247
AB  - Scanning electron microscopy (SEM) is widely used for evaluating laser-treated surfaces, offering a broad range of magnifications and the capability to perform three-dimensional (3D) reconstructions without the need for conventional profilometers....
LA  - eng
PB  - Springer
KW  - Topography
KW  - Stereophtogrammetry
KW  - Setero-pair
KW  - 3D SEM
KW  - Femtosecond laser
KW  - Laser surface texturing
TI  - Comparative study of focus variation microscopy and SEM stereoscopic reconstruction for characterizing ablation phenomena in laser surface texturing of WC-Co material
DO  - 10.1007/s00170-025-17101-6
ER  -