TY  - GEN 
AU  - Sales Lérida, David
AU  - Pizarro Junquera, Joaquín
AU  - Galindo Reaño, Pedro Luis
AU  - García Roja, Rafael
AU  - Trevisi, G.
AU  - Frigeri, P
AU  - Nasi, L
AU  - Franchi, S.
AU  - Molina Rubio, Sergio Ignacio
A4  - Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
A4  - Lenguajes y Sistemas Informáticos
PY  - 2007
SN  - 0957-4484
UR  - http://hdl.handle.net/10498/7231
AB  - A novel peak finding method to map the strain from high resolution transmission electron micrographs, known as the Peak Pairs method, has been applied to In(Ga) As/AlGaAs quantum dot (QD) samples, which present stacking faults emerging from the QD...
LA  - eng
KW  - Molecular-Beam Epitaxy
KW  - Transmission Electron-Microscopy
KW  - Gaas
KW  - Fields
KW  - Layer
KW  - Photoluminescence
KW  - Distributions
KW  - Operation
KW  - Storage
KW  - Ingaas
TI  - Critical Strain Region Evaluation of Self-Assembled Semiconductor Quantum Dots
DO  - 10.1088/0957-4484/18/47/475503
ER  -