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Mostrando ítems 1-11 de 11

Application of the Holomorphic Tauc-Lorentz-Urbach Function to Extract the Optical Constants of Amorphous Semiconductor Thin Films

Ballester, Manuel; García, Marcos; Márquez Lozano, Almudena del Pilar; Blanco Ollero, Eduardo; Fernández, Susana M.; Minkov, Dorian; Katsaggelos, Aggelos K.; Cossairt, Oliver; Willomitzer, Florian; Márquez Navarro, Emilio José (MDPI, 2022-10)
Comprehensive Optoelectronic Study of Copper Nitride: Dielectric Function and Bandgap Energies

Ballester, Manuel; Marquez, Almudena P.; Blanco Ollero, Eduardo; Mánuel, José M.; Rodriguez-Tapiador, Maria I.; Fernandez, Susana M.; Willomitzer, Florian; Katsaggelos, Aggelos K.; Márquez Navarro, Emilio José (Multidisciplinary Digital Publishing Institute (MDPI), 2025)
Enhancing the Swanepoel method: precise envelope detection of thin-film transmission spectra

Ballester, Manuel; Márquez Lozano, Almudena del Pilar; López-Tapia, Santiago; Fernández, Susana; Bass, John; Minkov, Dorian; Márquez Navarro, Emilio José; Katsaggelos, Aggelos K.; Willomitzer, Florian; Wuersch, Christoph (Optica Publishing Group, 2025)
Further Increasing the Accuracy of Characterization of a Thin Dielectric or Semiconductor Film on a Substrate from Its Interference Transmittance Spectrum

Minkov, Dorian; Márquez Navarro, Emilio José; Angelov, George; Gavrilov, Gavril; Ruano, Susana; Saugar, Elias (MDPI, 2021-08)
Hybrid Dispersion Model Characterization of PAZO Azopolymer Thin Films over the Entire Transmittance Spectrum Measured in the UV/VIS/NIR Spectral Region

Minkov, Dorian; Nedelchev, Lian; Angelov, George; Márquez Navarro, Emilio José; Blagoeva, Blaga; Mateev, Georgi; Nazarova, Dimana (MDPI, 2022)
Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample

Minkov, Dorian; Angelov, George; Márquez Navarro, Emilio José; Radonov, R.; Rusev, R.; Nikolov, D.; Ruano, S. (Multidisciplinary Digital Publishing Institute (MDPI), 2023)
Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity

Márquez Navarro, Emilio José; Blanco Ollero, Eduardo; Manuel Delgado, José Manuel; Ballester, M.; García-Gurrea, M.; Rodríguez-Tapiador, M.I.; Fernández, S.M.; Willomitzer, Florian; Katsaggelos, Aggelos K. (MDPI, 2024)
Optical Characterization of H-Free a-Si Layers Grown by rf-Magnetron Sputtering by Inverse Synthesis Using Matlab: Tauc–Lorentz–Urbach Parameterization

Márquez Navarro, Emilio José; Ruiz Pérez, Juan José; Ballester, Manuel; Márquez Lozano, Almudena del Pilar; Blanco Ollero, Eduardo; Minkov, Dorian; Fernández Ruano, Susana M.; Saugar, Elias (MDPI, 2021-11)
Optical Properties of Reactive RF Magnetron Sputtered Polycrystalline Cu3N Thin Films Determined by UV/Visible/NIR Spectroscopic Ellipsometry: An Eco-Friendly Solar Light Absorber

Márquez Navarro, Emilio José; Blanco Ollero, Eduardo; García-Gurrea, M.; Cintado-Puerta, M.; Domínguez de la Vega, Manuel; Ballester, Manuel; Manuel Delgado, José Manuel; Rodríguez-Tapiador, M.I.; Fernández, S.M. (MDPI, 2023)
Optical Transmittance for Strongly-Wedge-Shaped Semiconductor Films: Appearance of Envelope-Crossover Points in Amorphous As-Based Chalcogenide Materials

Ruiz Pérez, Juan José; Márquez Navarro, Emilio José (MDPI, 2020-11)
Review and novel formulae for transmittance and reflectance of wedged thin films on absorbing substrates

Ballester, Manuel; Márquez Navarro, Emilio José; Bass, John; Würsch, Christoph; Willomitzer, Florian; Katsaggelos, Aggelos K. (Institute of Physics, 2025)