Induced damage during STEM-EELS analyses on acrylic-based materials for Stereolithography

Identificadores
URI: http://hdl.handle.net/10498/27273
DOI: 10.1016/j.polymdegradstab.2022.110044
ISSN: 0141-3910
Statistics
Metrics and citations
Metadata
Show full item recordDate
2022-09Department
Ciencia de los Materiales e Ingeniería Metalúrgica y Química InorgánicaSource
Polymer Degradation and Stability 203 (2022) 110044Abstract
(Scanning) transmission electron microscopy, (S)TEM, offers a powerful characterization tool based on electronmatter
interactions, highly valuable in materials science. However, the possible electron beam induced damage
during (S)TEM measurements hinders the analysis of soft materials, such as acrylic resins. Importantly, acrylic
resins offer an appealing playground for the development of novel composites with customized properties and
convenient processing capabilities for 3D-printing technologies, including Stereolithography (SLA). There are
several factors preventing the optimal performance of TEM measurements applied to acrylic resins, among which
we focus on the quality of the analyzed specimen (i.e., compromise between thickness and robustness, to achieve
electron transparency while keeping the material integrity), particularly challenging when working with soft
materials; the electrostatic charging/discharging effects, resulting in sample drift and related noise/artefacts; and
the radiolysis and knock-on electron-induced damage, which directly degrade the material under study. We
explore and compare different methodologies to obtain resin specimens suitable for (S)TEM analysis, employed
for the subsequent study of the electron–beam damage induced during STEM-EELS measurements. Furthermore,
we propose likely underlying mechanisms explaining the acrylic resin degradation based on the different EELS
monitored signals. On one hand, we assess the evolution of the carbon and oxygen content, as well as the material
thinning as a function of the accumulated electron dose. On the other hand, we extract meaningful information
from the spectral shape of carbon and oxygen K-edges upon increasing electron doses, unraveling
likely degradation pathways. The earned understanding on the electron-beam induced damage and the determination
of critical doses provide a useful framework for the implementation of (S)TEM techniques as useful
tools to help in the smart engineering of acrylic-based composites for SLA.
Subjects
STEM-EELS; Acrylic resin; Electron-beam damage; Degradation mechanism; Radiolysis; Knock-onCollections
- Artículos Científicos [11777]
- Articulos Científicos CC. Mat. [566]
- Artículos Científicos IMEYMAT [565]






