Modification of the LM124 Single Event Transients by Load Resistors

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URI: http://hdl.handle.net/10498/30771

DOI: 10.1109/TNS.2009.2037894

ISSN: 018-9499

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Author/s
Franco, F.J.; López Calle, IsabelAuthority UCA; Izquierdo, J.G.; Agapito, J.G.
Date
2010-02
Department
Ingeniería en Automática, Electrónica, Arquitectura y Redes de Computadores
Source
IEEE Transactions on Nuclear Science, vol. 57, no. 1, pp. 358-365, Feb. 2010,
Abstract
The influence of a load resistor on the shape of the single event transients was investigated in the LM124 operational amplifier by means of laser tests. These experiments indicated that, as a general rule, load resistors modify the size of the transients. SPICE simulations helped to understand the reasons of this behavior and showed that the distortion is related to the necessity of providing or absorbing current from the load resistor, which forces the amplifier to modify its operation point. Finally, load effects were successfully used to explain the distortion of single event transients in typical feed-back networks and the results were used to explain experimental data reported elsewhere.
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