Strain mapping accuracy improvement using super-resolution techniques

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URI: http://hdl.handle.net/10498/32023

DOI: 10.1111/jmi.12341

ISSN: 0022-2720

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Author/s
Barcena González, GuillermoAuthority UCA; Guerrero Lebrero, María de la PazAuthority UCA; Guerrero Vázquez, ElisaAuthority UCA; Fernández de los Reyes, DanielAuthority UCA; González Robledo, DavidAuthority UCA; Mayoral, Álvaro; Utrilla, Antonio D.; Ulloa, José María; Galindo Riaño, Pedro LuisAuthority UCA
Date
2015-10-26
Advisor
Barcena González, GuillermoAuthority UCA
Department
Ingeniería Informática; Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
Source
Journal of Microscopy, Vol. 00, Issue 0 2015, pp. 1–9
Abstract
Super-resolution (SR) software-based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high-resolution high-angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal-to-noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images.
Subjects
High-resolution; High-angular annular dark field; Image reconstruction; Strain analysis
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Attribution-NonCommercial-NoDerivatives 4.0 Internacional
This work is under a Creative Commons License Attribution-NonCommercial-NoDerivatives 4.0 Internacional