Strain mapping accuracy improvement using super-resolution techniques

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2015-10-26Director/Tutor
Barcena González, Guillermo
Departamento/s
Ingeniería Informática; Ciencia de los Materiales e Ingeniería Metalúrgica y Química InorgánicaFuente
Journal of Microscopy, Vol. 00, Issue 0 2015, pp. 1–9Resumen
Super-resolution (SR) software-based techniques aim at generating a final image by combining several noisy frames with lower resolution from the same scene. A comparative study on high-resolution high-angle annular dark field images of InAs/GaAs QDs has been carried out in order to evaluate the performance of the SR technique. The obtained SR images present enhanced resolution and higher signal-to-noise (SNR) ratio and sharpness regarding the experimental images. In addition, SR is also applied in the field of strain analysis using digital image processing applications such as geometrical
phase analysis and peak pairs analysis. The precision of the strain mappings can be improved when SR methodologies are applied to experimental images.
Materias
High-resolution; High-angular annular dark field; Image reconstruction; Strain analysisColecciones
- Artículos Científicos [12001]
- Articulos Científicos CC. Mat. [579]
- Articulos Científicos Ing. Inf. [313]





