Wafer-Scale Two-Dimensional Semiconductors for Deep UV Sensing

Identificadores
URI: http://hdl.handle.net/10498/32125
DOI: https://doi.org/10.1002/SMLL.202305865
ISSN: 1613-6829
ISSN: 1613-6810
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Shiffa, Mustaqeem; Dewes, Benjamin T.; Bradford, Jonathan; Cottam, Nathan D.; Cheng, Tin S.; Mellor, Christopher J.; Makarovskiy, Oleg; Rahman, Kazi; O'Shea, James N.; Beton, Peter H.; Novikov, Sergei V.; Ben Fernández, Teresa
; González Robledo, David
; Xie, Jiahao; Zhang, Lijun; Patanè, Amalia
Date
2024Department
Ciencia de los Materiales e Ingeniería Metalúrgica y Química InorgánicaSource
Small - 2024, Vol. 20 n.7Abstract
2D semiconductors (2SEM) can transform many sectors, from information and communication technology to healthcare. To date, top-down approaches to their fabrication, such as exfoliation of bulk crystals by “scotch-tape,” are widely used, but have limited prospects for precise engineering of functionalities and scalability. Here, a bottom-up technique based on epitaxy is used to demonstrate high-quality, wafer-scale 2SEM based on the wide band gap gallium selenide (GaSe) compound. GaSe layers of well-defined thickness are developed using a bespoke facility for the epitaxial growth and in situ studies of 2SEM. The dominant centrosymmetry and stacking of the individual van der Waals layers are verified by theory and experiment; their optical anisotropy and resonant absorption in the UV spectrum are exploited for photon sensing in the technological UV-C spectral range, offering a scalable route to deep-UV optoelectronics.
Subjects
gallium selenide; molecular beam epitaxy; optoelectronics; photodetectorsCollections
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- Articulos Científicos CC. Mat. [579]
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