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Role of Sb on the vertical-alignment of type-II strain-coupled InAs/GaAsSb multi quantum dots structures

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URI: http://hdl.handle.net/10498/38890

DOI: 10.1016/J.JALLCOM.2020.154914

ISSN: 1873-4669

ISSN: 0925-8388

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Author/s
Ruiz Marín, NazaretAuthority UCA; Fernández de los Reyes, DanielAuthority UCA; Braza Blanco, María VerónicaAuthority UCA; Flores Gallegos, SaraAuthority UCA; Stanojevic, Lazar; Gonzalo, Alicia; Utrilla, Antonio; Ulloa, Jose María; Ben Fernández, TeresaAuthority UCA; González Robledo, DavidAuthority UCA
Date
2020-08-15
Department
Ciencia de los Materiales e Ingeniería Metalúrgica y Química Inorgánica
Source
Journal of Alloys and Compounds - 2020, Vol. 832, 154914
Abstract
The implementation of GaAs0.8Sb0.2 as CL to obtain type-II strain-coupled InAs MQD structures has been examined and compared to similar structures without Sb or without strain coupling. First, it has been demonstrated that capping with GaAsSb prevents the formation of In-rich agglomerations that hampered the QD formation as it has been observed in the sample without Sb. Instead, it promotes the vertical alignment (VA) of almost all QDs with a high density of QD columns. Second, there is a preferential Sb accumulation over the dots together with an undulation of the growth front, contrary to the observed in the uncoupled structure. In case of a deficient covering of GaAsSb, as occurs for giant QDs, In-rich agglomerations may develop. Each VAQD column consists of a sequence of alternating quantum blocks of pyramid-shaped In(Ga)As separated by GaAsSb blocks that rest over them. These Sb-rich blocks are not homogeneous accumulating around the pyramidal apex like a collar. Between the columns, there is an impoverishment of In and Sb compared to the uncoupled sample. These columns can behave as self-aligned nanowires with type II band alignment between self-assembled InAs and GaAsSb quantum blocks that opens new opportunities for novel devices.
Subjects
Vertical aligned quantum dots; GaAsSb capping layer; III-V semiconductors alloys; Composition distribution; Transmission electron microscopy
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  • Artículos Científicos [11973]
  • Articulos Científicos CC. Mat. [579]
  • Artículos Científicos IMEYMAT [578]
Attribution-NonCommercial-NoDerivatives 4.0 Internacional
This work is under a Creative Commons License Attribution-NonCommercial-NoDerivatives 4.0 Internacional

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