SRAMs SEL and SEU In-Flight Data From PROBA-II Spacecraft

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URI: http://hdl.handle.net/10498/30877

DOI: 10.1109/RADECS.2013.6937398

ISSN: 978-146735057-0

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Autor/es
D'Alessio, M.; Poivey, C.; Ferlet-Cavrois, V.; Evans, H.; Harboe-Sorensen, R.; Keating, A.; López Calle, IsabelAutoridad UCA; Guerre, F.X.; Lochon, F.; Santandrea, S.; Zadeh, A.; Muschitiello, M.; Markgraf, M.; Montenbruck, O.; Grillenberger, N.; Fleurinck, N.; Puimege, K.; Gerrits, D.; Matthijs, P.
Fecha
2013-09
Departamento/s
Ingeniería en Automática, Electrónica, Arquitectura y Redes de Computadores
Fuente
4th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Oxford, UK, 2013, pp. 1-8
Resumen
This paper presents an analysis of the SEE in-flight data of SRAMs on board Proba-II spacecraft. Proba-II spacecraft has been flying on a LEO orbit for more than 3 years. Observed in-flight error rates are compared with predictions based on ground test data.
Materias
Time division multiplexing;Random access memory;Global Positioning System;Monitoring;Temperature sensors;Protons;Temperature measurement;Single Event Effect (SEE);Single Event Upset (SEU);Single Event Latch-up (SEL);radiation experiment;radiation monitor;Static Random Access Memory (SRAM);technology demonstration;hardness assurance
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